oneOverview:
Four probe method, capable of measuring resistance ranging from micro ohms to megaohms, usingAD chip control, constant current output, PC software operation, automatic data measurement and coefficient correction, direct reading of square resistance, resistance, resistivity, and conductivity data; Chinese or English language version; Has shielding function; Refer to the American A.S.T.M standard.Physical testing methods for monocrystalline silicon
Research and development of four probe tester
twoScope of application:
1. Conductive new materials, aluminum foil, copper foil, aluminum coating, carbon fiber materials, electrode materials;
2. Research on general coating materials, films, and thin film substrates
3. Universities, research institutes, and R&D departments conduct research on the wide range resistivity or conductivity properties of new materials
threeParameter information:
Specification and model
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FT-3671A Economic Type
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FT-3671B Automatic Type
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1. Range of block resistance
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10^6~2×10^7Ω/□
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2. Range of resistivity
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10^7~2×10^8Ω-cm
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3. Test current range
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1A、100mA、10mA、1mA、100uA、10uA、1uA、0.1uA,
100nA ,10nA , 1nA
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4. Current accuracy
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1A、100mA、10mA、1mA、100uA、10uA、1uA、0.1uA±0.1%; 100nA ,10nA , 1nA±2%
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5. Resistance accuracy
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10^2ΩThe following ranges≤0.5%;10^2ΩThe above range≤10%;
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6. PC software interface operation
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PC software interface display: resistance, resistivity, square resistance, conductivity, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, process map, report generation
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7. Testing method
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manual measurement
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automatic measurement
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8. Working power supply
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Input: AC 220V±10%.50Hz power consumption:<100W
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9. Error
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small range≤4%(Standard sample results); large range≤10%
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10. Calibration method
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Standard resistors and standard samples
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11. Test probe
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Probe spacing selection: 2mm; Two specifications of 3mm; Probe material selection: tungsten carbide needle, gold-plated phosphor copper hemispherical needle
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